Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28 nm FDSOI technology Academic Article

authors

publication date

July 3, 2015

published in

Microelectronics Reliability Journal

Digital Object Identifier (DOI)

https://doi.org/10.1016/j.microrel.2015.06.023

has global citation frequency

https://vivo.tib.eu/demo/individual/gcf_W763316829 Global Citation Count

start page

1323

end page

1327

volume

55

issue

9-10