selected publications

• academic article

  • Compact model for Perpendicular Magnetic Anisotropy Magnetic Tunnel Junction.  .  2017
  • Breakdown Analysis of Magnetic Flip-Flop With 28-nm UTBB FDSOI Technology.  IEEE Transactions on Device and Materials Reliability.  16:376-383. 2016
  • Low Power Magnetic Flip-Flop Optimization With FDSOI Technology Boost.  IEEE Transactions on Magnetics.  52:1-7. 2016
  • Compact Model of Dielectric Breakdown in Spin-Transfer Torque Magnetic Tunnel Junction.  IEEE Transactions on Electron Devices.  63:1762-1767. 2016
  • Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28 nm FDSOI technology.  Microelectronics Reliability.  55:1323-1327. 2015
  • Multiplexing Sense-Amplifier-Based Magnetic Flip-Flop in a 28-nm FDSOI Technology.  IEEE Transactions on Nanotechnology.  14:761-767. 2015
  • Cross-layer investigation of continuous-time sigma–delta modulator under aging effects.  Microelectronics Reliability.  55:645-653. 2014