Reliability analysis of hybrid spin transfer torque magnetic tunnel junction/CMOS majority voters Academic Article

authors

publication date

September 1, 2016

published in

Microelectronics Reliability Journal

Digital Object Identifier (DOI)

https://doi.org/10.1016/j.microrel.2016.07.074

has global citation frequency

https://vivo.tib.eu/demo/individual/gcf_W2520701884 Global Citation Count

start page

48

end page

53

volume

64