selected publications

• academic article

  • Reliability analysis of hybrid spin transfer torque magnetic tunnel junction/CMOS majority voters.  Microelectronics Reliability.  64:48-53. 2016
  • Compact Model of Dielectric Breakdown in Spin-Transfer Torque Magnetic Tunnel Junction.  IEEE Transactions on Electron Devices.  63:1762-1767. 2016

• conference paper

  • Efficient computation of combinational circuits reliability based on probabilistic transfer matrix.  . 1-4. 2014