An efficient tool for reliability improvement based on TMR Academic Article

authors

publication date

August 9, 2010

published in

Microelectronics Reliability Journal

Digital Object Identifier (DOI)

https://doi.org/10.1016/j.microrel.2010.07.095

has global citation frequency

https://vivo.tib.eu/demo/individual/gcf_W2128239371 Global Citation Count

start page

1247

end page

1250

volume

50

issue

9-11