selected publications

• academic article

  • Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28 nm FDSOI technology.  Microelectronics Reliability.  55:1323-1327. 2015
  • Compact thermal modeling of spin transfer torque magnetic tunnel junction.  Microelectronics Reliability.  55:1649-1653. 2015
  • A dual-rail compact defect-tolerant multiplexer.  Microelectronics Reliability.  55:662-670. 2015