selected publications

• academic article

  • Cross-layer investigation of continuous-time sigma–delta modulator under aging effects.  Microelectronics Reliability.  55:645-653. 2014
  • Using error tolerance of target application for efficient reliability improvement of digital circuits.  Microelectronics Reliability.  50:1219-1222. 2010
  • An efficient tool for reliability improvement based on TMR.  Microelectronics Reliability.  50:1247-1250. 2010
  • Scattering effects on the performance of carbon nanotube field effect transistor in a compact model.  The European Physical Journal B.  73:223-227. 2009

• conference paper

  • Efficient computation of combinational circuits reliability based on probabilistic transfer matrix.  . 1-4. 2014
  • Reliability analysis of a Reed-Solomon decoder.  2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS). 438-441. 2012
  • On the output events in concurrent error detection schemes.  . 978-981. 2008