publication venue for
- Low-Pass NGD Numerical Function and STM32 MCU Emulation Test. 69:8346-8355. 2021
- Automatic and Robust Object Detection in X-Ray Baggage Inspection Using Deep Convolutional Neural Networks. 68:10248-10257. 2020
IEEE Transactions on Industrial Electronics
Journal
Overview
Identity
International Standard Serial Number (ISSN)
- 0278-0046