Low-Pass NGD Numerical Function and STM32 MCU Emulation Test Academic Article

authors

publication date

September 10, 2021

published in

IEEE Transactions on Industrial Electronics Journal

Digital Object Identifier (DOI)

https://doi.org/10.1109/tie.2021.3109543

has global citation frequency

https://vivo.tib.eu/demo/individual/gcf_W3200165162 Global Citation Count

start page

8346

end page

8355

volume

69

issue

8