selected publications

• academic article

  • Critical Gates Identification for Fault-Tolerant Design in Math Circuits.  Journal of Electrical and Computer Engineering.  2017:1-7. 2017
  • Progressive module redundancy for fault-tolerant designs in nanoelectronics.  Microelectronics Reliability.  51:1489-1492. 2011

• conference paper

  • Reliability analysis of a Reed-Solomon decoder.  2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS). 438-441. 2012