selected publications

• academic article

  • Sensitivity analysis of the electrostatic interaction between the atomic force microscopy probe and a thin dielectric film with 3D-localized charge cloud.  Journal of Applied Physics.  125. 2019
  • Numerical simulations for quantitative analysis of electrostatic interaction between atomic force microscopy probe and an embedded electrode within a thin dielectric: meshing optimization, sensitivity to potential distribution and impact of cantilever contribution.  Journal of Physics D Applied Physics.  51:165302-165302. 2018
  • Sensitivity analysis of the electrostatic force distance curve using Sobol’s method and design of experiments.  Journal of Physics D Applied Physics.  50:035304-035304. 2016

• conference paper

  • Numerical Simulations for Sensitivity Analysis of the Electrostatic Force Curve on Charge Localization in 3D.  2018 IEEE 2nd International Conference on Dielectrics (ICD). 1-4. 2018
  • Inverse modelling for 3D Nano-localization of charges in thin dielectric.  HAL (Le Centre pour la Communication Scientifique Directe). 2017
  • DC CONTACT MODELING OF ELECTROSTATICALLY ACTUATED SWITCHES WITH LOW VOLTAGE.  HAL (Le Centre pour la Communication Scientifique Directe). 2009