selected publications
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academic article
- Refining the physical description of charge trapping and detrapping in a transport model for dielectrics using an optimization algorithm. COMPEL The International Journal for Computation and Mathematics in Electrical and Electronic Engineering. 42:1923-1937. 2023
- Use of Sobol indexes for efficient parameter estimation in a charge transport model. IEEE Transactions on Dielectrics and Electrical Insulation. 26:584-592. 2019
- Sensitivity analysis of the electrostatic interaction between the atomic force microscopy probe and a thin dielectric film with 3D-localized charge cloud. Journal of Applied Physics. 125. 2019
- Numerical simulations for quantitative analysis of electrostatic interaction between atomic force microscopy probe and an embedded electrode within a thin dielectric: meshing optimization, sensitivity to potential distribution and impact of cantilever contribution. Journal of Physics D Applied Physics. 51:165302-165302. 2018
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conference paper
- Numerical Simulations for Sensitivity Analysis of the Electrostatic Force Curve on Charge Localization in 3D. 2018 IEEE 2nd International Conference on Dielectrics (ICD). 1-4. 2018
- Inverse modelling for 3D Nano-localization of charges in thin dielectric. HAL (Le Centre pour la Communication Scientifique Directe). 2017
- Parameters sensitivity analysis in charge transport model for dielectric materials using Sobol indexes. HAL (Le Centre pour la Communication Scientifique Directe). 2017
- Parameters sensitivity analysis in charge transport model using Sobol indexes for optimization purpose. . 832-835. 2016