selected publications

• academic article

  • Sensitivity analysis of the electrostatic interaction between the atomic force microscopy probe and a thin dielectric film with 3D-localized charge cloud.  Journal of Applied Physics.  125. 2019
  • Numerical simulations for quantitative analysis of electrostatic interaction between atomic force microscopy probe and an embedded electrode within a thin dielectric: meshing optimization, sensitivity to potential distribution and impact of cantilever contribution.  Journal of Physics D Applied Physics.  51:165302-165302. 2018