A Physics-Inspired Deep Learning Framework for an Efficient Fourier Ptychographic Microscopy Reconstruction under Low Overlap Conditions Academic Article

authors

publication date

July 31, 2023

published in

Sensors Journal

Digital Object Identifier (DOI)

https://doi.org/10.3390/s23156829

has global citation frequency

https://vivo.tib.eu/demo/individual/gcf_W4385416788 Global Citation Count

start page

6829

end page

6829

volume

23

issue

15