Diffracting-grain identification from electron backscatter diffraction maps during residual stress measurements: a comparison between the sin²ψ and cosα methods Academic Article

authors

publication date

July 24, 2019

published in

Journal of Applied Crystallography Journal

Digital Object Identifier (DOI)

https://doi.org/10.1107/s1600576719008744

has global citation frequency

https://vivo.tib.eu/demo/individual/gcf_W2963199718 Global Citation Count

start page

828

end page

843

volume

52

issue

4