Soft Error Detection and Correction Technique for Radiation Hardening Based on C-element and BICS Academic Article

authors

publication date

September 10, 2014

published in

IEEE Transactions on Circuits & Systems II Express Briefs Journal

Digital Object Identifier (DOI)

https://doi.org/10.1109/tcsii.2014.2356911

has global citation frequency

https://vivo.tib.eu/demo/individual/gcf_W1995463539 Global Citation Count

start page

952

end page

956

volume

61

issue

12